Wednesday, June 16, 2010

SPECTRAL EVOLUTION to display SR-1900 series spectroradiometers for solar simulator validation

Intersolar North America, NORTH ANDOVER, USA: Capitalizing on its 6 year reputation as a worldwide OEM provider of superior InGaAs spectroradiometer instruments, SPECTRAL EVOLUTION has announced a new line of laboratory spectroradiometers designed specifically for the solar simulator industry.

These lightweight, dual detector instruments feature both a 512-element Si photodiode array as well as a 256-element extended range InGaAs array to cover simultaneous detection of 300-1900nm with one easy, fast measurement.

The recently released SR-1900 is configured for rapid analysis of continuous solar simulators and includes SPECTRAL EVOLUTION's exclusive DARWin SP Data Analysis software package which comes with routines to measure the Class A performance of solar simulators as per ASTM Specification (E892) and for monitoring spectral match as per ASTM E927-05 and IEC 60904-9.

Each SR-1900 comes complete with a permanently mounted 0.5 meter fiber optic cable and right angle diffuser for easy setup. All units feature auto-exposure settings and integral dark current shutter for rapid one-touch operation.

For pulsed solar simulators, SPECTRAL EVOLUTION announces its latest addition, the SR-1900P which features multiple triggering modes to synchronize data collection with the pulse of the simulator. Both units feature diffraction grating-based optics with no moving parts for increased reliability and measurement flexibility. Each unit may be ordered with a lightweight padded travel case for easy portability.

SPECTRAL EVOLUTION will be exhibiting at Intersolar North America 2010 in San Francisco's Moscone Center West Hall from July 13-15, booth number 8017. SPECTRAL EVOLUTION will also be displaying its newly upgraded line of near infrared spectrometers for measuring diffuse reflectance samples. These units feature diffraction-based optics and TE-cooled extended InGaAs arrays for superior performance.

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